Nano-Chip 4-Probe Method Design

Closed 4-point probe feedback loop provides maximum versatility in controlling stimulus and measuring response with accuracy (≥95%) and uniformity (e99.5%).

Obtain temperatures up to 1300°C and electric fields above 300 kv/cm at 900C. Detects currents in the range of 1pA-100mA and performs AC measurements up to 100 H

E-fields up to 300 kV/cm at 900°C
Unique SiNx Window for Compatible Sample Types

With the unique SiNx window design, it is easy to place sample flakes or nanowires in the elongated window, or select the SiNx window to support nanoparticles.

Unique SiNx Window Design
Multiple chip configurations for easy upgrading

Different configurations are available to suit your experimental needs. Choose from dedicated bias or heating chips and simultaneous bias + heating. Supports configuration upgrades during subsequent use, realizing diverse experimental designs.

Heating or biasing or heating and biasing at the same time.
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